(Materials Research Instrument Facility)

The Microscopy Cluster of MRIF is a central shared facility for microanalysis. It plays an important role in providing microanalysis services and research collaborations to the researchers on the campus of University at Buffalo, as well as off-campus industries and other institutions in the Buffalo area and elsewhere in the state.

Capabilities:

A JEOL JEM 2010 high-resolution electron microscope was set up in 1997 to satisfy needs for microstructural studies of materials and device structures. The maximum accelerating voltage of the TEM is 200KV, and the point resolution is 0.194nm. There are still other functions with the TEM, such as EDS, CBD and NBD. The cluster is equipped with several necessary

instruments for TEM sample preparation, such as an Ion Mill (306-1 by VCR Group, Inc.), a Dimpler (D500 by VCR Group, Inc.), a Wire Saw (WS-22 by Princeton Scientific Corp.) and grinding /polishing machines (by Struers). A full dark room can provide high quality photographic services.

In the near future, a JEOL SEM 5300 with EDAX (Department of Geology) will be consolidated in this facility along with a new shared-use Atomic Force Microscope (AFM) (Quesant Instruments - Resolver). A new digital optical microscope (AX70TRF by Olympus) which has Brightfield/Darkfield/Nomarski/Polarized/Fluorescence modes is also being set up in the cluster.

Instrumentation:

1. JEOL JEM 2010 High Resolution Electron Microscope (HREM)

2. JEOL SEM 5300 Scanning Electron Microscope (SEM)

3. Quesant Instruments Inc. - Resolver Atomic Force Microscope (AFM)

4. Digital Optical Microscope (DOP) - Olympus AX70TRF

5. VCR 306-1 Ion Mill

6. VCR D500 Dimpler

7. W-22 Wire Saw

Question/concern, please click here.