Operated at higher accelerating voltage (80 to 200KV) with a conventional electron source (LaB6 filament), JEM 2010 high accuracy analytical electron microscope allows both high resolution and accurate elemental micro-analysis

Operated at higher accelerating voltage (80 to 200KV) with a conventional electron source (LaB₆ filament), JEM 2010 high accuracy analytical electron microscope allows both high resolution and accurate elemental micro-analysis. Its point resolution is 0. 19nm, and the magnification is from X50 to 1,500,000. It is equipped with a 5-axis micro-active goniometer, which makes the micro-structure analysis for many kinds of crystalline materials feasible and very convenient. The TEM can provide the morphology images both in bright field and dark field, the corresponding crystal structures by

electron diffraction function, and the elemental composition (from carbon to heavier elements in the Periodic Table) by the installed EDX analysis system (PRISM Digital Spectrometer, manufactured by PGT-Princeton Gamma-Tech). The Convergent Beam Diffraction (CBD) mode is very helpful to analyze the crystal symmetry and the Nano Beam Diffraction (NBD) mode will provide the crystal structure for nano-particles. TEM samples must be 3mm in diameter, and the thickness of the thinning area should be less than 4OOm-n for general image and I 00nm for high resolution image.